Tag Archives: Robin John

Indian researchers establish a multiplex number to identify efficiency of multilevel resistive switching devices

There’s a Feb. 1, 2016 Nanowerk Spotlight article by Dr. Abhay Sagade of Cambridge University (UK) about defining efficiency in memristive devices,

In a recent study, researchers at the Jawaharlal Nehru Centre for Advanced Scientific Research (JNCASR), Bangalore, India, have defined a new figure-of-merit to identify the efficiency of resistive switching devices with multiple memory states. The research was carried out in collaboration with the Indian Institute of Technology Madras (IITM), Chennai, and financially supported by Department of Science and Technology, New Delhi.

The scientists identified the versatility of palladium oxide (PdO) as a novel resistive switching material for use in resistive memory devices. Due to the availability to switch multiple redox states in the PdO system, researchers have controlled it by applying different amplitudes of voltage pulses.

To date, many materials have shown multiple memory states but there have been no efforts to define the ability of the fabricated device to switch between all possible memory states.

In this present report, the authors have defined the efficacy in a term coined as “multiplex number (M)” to quantify the performance of a multiple memory switching device:

For the PdO MRS device with five memory states, the multiplex number is found to be 5.7, which translates to 70% efficiency in switching. This is the highest value of M observed in any multiple memory device.

As multilevel resistive switching devices are expected to have great significance in futuristic brain-like memory devices [neuromorphic engineering products], the definition of their efficiency will provide a boost to the field. The number M will assist researches as well as technologist in classifying and deciding the true merit of their memory devices.

Here’s a link to and a citation for the paper Sagade is discussing,

Defining Switching Efficiency of Multilevel Resistive Memory with PdO as an Example by K. D. M. Rao, Abhay A. Sagade, Robin John, T. Pradeep and G. U. Kulkarni. Advanced Electronic Materials Volume 2, Issue 2, February 2016 DOI: 10.1002/aelm.201500286

© 2016 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim

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